Test mode for multi-chip integrated circuit packages

ABSTRACT

When a test mode of a controller of a multi-chip integrated circuit package is activated, external signal lines coupled to the controller are re-mapped to signal lines of one of the integrated circuit devices of the multi-chip integrated circuit package to permit direct testing of the integrated circuit device.

RELATED APPLICATION

This is a divisional application of application Ser. No. 11/472,618,titled “TEST MODE FOR MULTI-CHIP INTEGRATED CIRCUIT PACKAGES,” filedJun. 22, 2006 (allowed), which application is assigned to the assigneeof the present invention and the entire contents of which areincorporated herein by reference.

TECHNICAL FIELD OF THE INVENTION

The present invention relates generally to integrated circuit devicesand in particular the present invention relates to a test mode formulti-chip integrated circuit packages.

BACKGROUND OF THE INVENTION

Multi-chip (or multi-die) memory packages contain a number of individualmemory devices, e.g., that may be stacked one above another. Each memorydevice may be a NAND or a NOR flash memory device, dynamic random accessmemory (DRAM) device, static random access memory (SRAM) device, or thelike. A multi-chip memory package typically includes a memory controllerfor accessing and controlling each memory device. The memory controllerusually includes external inputs and outputs for coupling to a hostdevice, such as a processor, a memory controller in a personal computer,a processor of tester hardware, etc. Problems arise during testing afterthe multi-chip memory package is assembled, such as during back-endtesting as part of the manufacturing process or during testing of adefective multi-chip memory package, e.g., returned by a user. Suchproblems occur because internal functioning of the memory devices cannotbe accessed directly through the external inputs and outputs of themulti-chip memory package.

For the reasons stated above, and for other reasons stated below whichwill become apparent to those skilled in the art upon reading andunderstanding the present specification, there is a need in the art foralternative test methods for multi-chip memory packages.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram illustrating a multi-chip integrated circuitpackage, according to an embodiment of the invention.

FIG. 2 is a block diagram illustrating a multi-chip integrated circuitpackage, according to another embodiment of the invention.

FIG. 3 is a simplified block diagram of a NAND flash memory devicecoupled to a memory controller, according to another embodiment of theinvention.

DETAILED DESCRIPTION

In the following detailed description of the invention, reference ismade to the accompanying drawings that form a part hereof, and in whichis shown, by way of illustration, specific embodiments in which theinvention may be practiced. In the drawings, like numerals describesubstantially similar components throughout the several views. Theseembodiments are described in sufficient detail to enable those skilledin the art to practice the invention. Other embodiments may be utilizedand structural, logical, and electrical changes may be made withoutdeparting from the scope of the present invention. The followingdetailed description is, therefore, not to be taken in a limiting sense,and the scope of the present invention is defined only by the appendedclaims and equivalents thereof.

FIG. 1 is a block diagram illustrating a multi-chip (or multi-die)integrated circuit package, such as a multi-chip memory device 100,according to an embodiment of the invention. The multi-chip integratedcircuit package includes a plurality of integrated circuit devices, suchas memory chips (or memory devices) 104. Examples of memory devicesinclude NAND or NOR flash memory devices, dynamic random access memorydevices (DRAMs), static random access memory devices (SRAMs), or thelike.

For one embodiment, a common control signal bus 110 is coupled to acontrol signal line 125 of each of memory devices 104; a common addressbus 115 is coupled to an address signal line 130 of each of memorydevices 104; and a common data bus 120 is coupled to a data signal line135 of each of memory devices 104. For another embodiment, multi-chipmemory device 100 includes a memory controller 150 that is separate frommemory devices 104. Memory controller 150 provides data signals, addresssignals, and control signals to each of memory devices 104 via data bus120, address bus 115, and control signal bus 110 through data (DQ) lines127, address lines 131, and control lines 137, respectively. For anotherembodiment, the address signals, data signals, and control signals arerespectively provided to each of memory devices 104 on a single sharedsignal line (or bus) by switching the respective signals onto the sharedbus. For yet another embodiment, address signals and data signals areprovided to each of memory devices 104 on a shared signal line (or bus),and the control signals are provided on a separate signal line.

FIG. 1 further shows that multi-chip memory device 100 may be coupled toa processor 170 to form part of an electronic system. For oneembodiment, multi-chip memory device 100 may be an active component ofthe electronic system or a device under test in the electronic system,where processor 170 forms a portion of a tester. Examples of electronicsystems include such systems as computer systems, peripheral devices,cellular and wireless devices, digital cameras, audio recorders,personal digital assistants (PDAs) and test equipment.

Processor 170 provides data signals, address signals, and controlsignals to memory controller 150 through external data signal line 155,external address signal line 160, and external control signal line 165,respectively. For another embodiment, the address signals, data signals,and control signals are respectively provided to memory controller 150on a single shared bus by switching the respective signals onto theshared bus. For yet another embodiment, address signals and data signalsare provided to memory controller 150 on a shared bus, and the controlsignals are provided on a separate line.

Memory controller 150 includes a test mode that is activated anddeactivated in response to receiving test-mode-activation andtest-mode-deactivation signals from processor 170. When the test mode isactivated, memory controller 150 maps at least a portion of the externalsignal lines of multi-chip memory device 100, e.g., external data line155, external address line 160, and external control line 165,respectively to at least a portion of the signal lines of a selectedmemory device 104, e.g., data line 125, address line 130, and controlline 135, in accordance with embodiments of the invention. Moreover,when the test mode is activated, controller 150 prevents, or at leastrestricts, communication between processor 170 and the remaining memorydevices 104 via the external signal lines, e.g., by respectivelypreventing or restricting all communication between processor 170 andthe remaining memory devices 104 or preventing outputs from theremaining memory devices 104 from reaching processor 170. For oneembodiment, the outputs from the remaining memory devices 104 may beprevented from reaching processor 170 by placing all of the signal linesof each remaining memory device in a high impedance (high Z) state.

Specifically, for one embodiment, at least the test-mode-activationsignal for activating the test mode includes an indicator that instructscontroller 150 to map external signal lines of multi-chip memory device100 to a particular memory device 104 when the test mode is activated.Further, in response to receiving the indicator, controller 150prevents, or at least restricts, communication between the remainingmemory devices 104 and processor 170. For another embodiment, inresponse to receiving the test-mode-deactivation signal, controller 150exits the test mode, and the relationship between the external signallines of multi-chip memory device 100 and the signal lines of theselected memory device 104 is restored to that which occurs duringnormal operation of controller 150, and normal communication betweencontroller 150 and processor 170 and between controller 150 and memorydevices 104 is also restored.

FIG. 2 is a block diagram illustrating a multi-chip (or multi-die)integrated circuit package, such as a multi-chip memory device 200,according to another embodiment of the invention. The multi-chipintegrated circuit package includes a plurality of integrated circuitdevices, such as memory chips (or memory devices) 204. Each of thememory devices 204 has an integrated memory controller 250. Each memorycontroller 250 provides data signals, address signals, and controlsignals to its respective memory device 204. For one embodiment, eachcontroller 250 provides the address signals, data signals, and controlsignals to its respective memory device 204 on a single shared bus byswitching the respective signals onto the shared bus. For yet anotherembodiment, each controller 250 provides address signals and datasignals to its respective memory device 204 on a shared bus, and thecontrol signals are provided on a separate line.

Multi-chip memory device 200 may be coupled to a processor 270 to formpart of an electronic system. For one embodiment, multi-chip memorydevice 200 may be an active component of the electronic system or adevice under test in the electronic system, where processor 270 forms aportion of a tester. Processor 270 provides data signals, addresssignals, and control signals to each memory controller 250 throughexternal data lines 255, external address signal lines 260, and externalcontrol signal lines 265, respectively. For another embodiment, theaddress signals, data signals, and control signals are respectivelyprovided to each memory controller 250 on a single shared bus byswitching the respective signals onto the shared bus. For yet anotherembodiment, address signals and data signals are provided memory eachcontroller 250 on a shared bus, and the control signals are provided ona separate line.

Each memory controller 250 includes a test mode that is activated anddeactivated in response to signals received from processor 270. When thetest mode is activated, the memory controller 250 whose test mode isactivated maps at least a portion of the external signal lines coupledto that memory controller 250, e.g., external data line 255, externaladdress line 260, and external control line 265 respectively to signallines of the memory device 204 having that memory controller 250integrated thereon in accordance with embodiments of the invention. Forone embodiment, processor 270 activates the test mode of a singlecontroller 250 by sending the signal for activating the test mode ofthat controller 250 to that controller 250. Substantially concurrently,for another embodiment, processor 270 sends a signal to each of theremaining controllers 250 that instructs these controllers 250 toprevent, or at least restrict, communication between their respectivememory devices 204 and processor 270 via the external signal lines e.g.,by respectively preventing or restricting all communication betweenprocessor 270 and the remaining memory devices 204 or preventing outputsfrom the remaining memory devices 204 from reaching processor 270.

For another embodiment, processor 270 may send a single signal to eachof controllers 250 for either activating a test mode of the controlleror restricting or preventing communication between the correspondingmemory device and the processor. For example, a test mode may beactivated for a memory device 204 if that memory device 204, e.g.,memory device 204 ₁, receives the signal, and communication may berestricted or prevented between the remaining memory devices, e.g.,memory devices 204 ₂ to 204 _(N), and the processor if those memorydevices receive the signal. For one embodiment, the signal may includean address of the memory device to be tested. The test mode is activatedfor the memory device whose address matches the address included in thesignal, whereas communication is restricted or prevented between theremaining memory devices having addresses that do not match the addressincluded in the signal.

For another embodiment, each memory controller 250 may include two testmodes that are activated and deactivated in response to signals receivedfrom processor 270. When a first test mode is activated, the controller250 maps at least a portion of the external signal lines respectively tosignal lines of the memory device 204 having that memory controller 250integrated thereon. When a second test mode is activated, the controller250 restricts or prevents communication between the memory device withthat controller 250 and processor 270. Note that for some embodiments, asingle signal may be received at each of the controllers from processor270. The first test mode is activated for the memory device whoseaddress matches the address included in the signal, whereas the secondtest mode is activated for those memory devices having addresses that donot match the address included in the signal. For another embodiment, todeactivate the first and second test modes, a single signal may be sentto each of the controllers from processor 270. Receiving the signal atthe controller whose first test mode is activated deactivates the firsttest mode and restores normal operation of that controller. Receivingthe signal at the controllers whose second test modes are activateddeactivates the second test modes and restores normal operation of thosecontrollers.

For another embodiment, processor 270 sends a signal to the controller250 whose test mode is activated instructing that controller 250 to exitthe test mode, and substantially concurrently, processor 270 sendssignals to the remaining controllers 250 instructing them to restorenormal communication between their respective memory devices andprocessor 270. In addition, exiting the test mode restores therelationship between the external signal lines coupled to memorycontroller 250 that was activated and the signal lines of the memorydevice 204 corresponding to that controller 250 to that which occursduring normal operation of controller 250. For another embodiment, asingle signal may be sent to each of the controllers from processor 270.When the signal is received by the controller whose test mode isactivated that controller exits the test mode, and when the signal isreceived at the controllers of each of the remaining memory devices,normal communication between these memory devices and processor 270 isrestored.

For some embodiments, one or more multi-chip memory packages 100 and/orone or more multi-chip memory packages 200 are included in a memorymodule, such as a memory card. Examples of memory modules includeCompactFlash™ memory cards licensed by SanDisk Corporation, MemoryStick™ memory cards licensed by Sony Corporation, SD Secure Digital™memory cards licensed by Toshiba Corporation, OneNAND licensed bySamsung Electronics Corporation, a USB flash drive, and the like. Forone embodiment, multi-chip memory device 100 may include externalconnections, such as pins, for interfacing with processor 170 forpassing control, address and/or data signals between multi-chip memorydevice 100 and processor 170, with processor 170 having compatiblereceptors for the external pins. Similarly, multi-chip memory device 200may include external connections, such as pins, for interfacing withprocessor 270 for passing control, address and/or data signals betweenmulti-chip memory device 200 and processor 270, with processor 270having compatible receptors for the external pins.

FIG. 3 is a simplified block diagram of a NAND flash memory device 304coupled to a memory controller 350, such as described above forcontroller 150 of FIG. 1 or each of controllers 250 of FIG. 2, as partof a multi-chip memory device, such as multi-chip memory device 100 ofFIG. 1 or multi-chip memory device 200 of FIG. 2, according to anotherembodiment of the invention. Memory device 304 includes an array ofmemory cells 306 arranged in rows and columns. A row decoder 308 and acolumn decoder 312 are provided to decode address signals. Addresssignals are received and decoded to access memory array 306. Memorydevice 304 also includes input/output (I/O) to manage input of commands,addresses and data to the memory device 304 as well as output of dataand status information from the memory device 304. An address register316 is coupled between I/O control circuitry 314 and row decoder 308 andcolumn decoder 312 to latch the address signals prior to decoding. Acommand register 328 is coupled between I/O control circuitry 314 andcontrol logic 318 to latch incoming commands. Control logic 318 controlsaccess to the memory array 306 in response to the commands and generatesstatus information for memory controller 350 and subsequently for aprocessor, such as processor 170 of FIG. 1 or processor 270 of FIG. 2.The control logic 318 is coupled to row decoder 308 and column decoder312 to control the row decoder 308 and column decoder 312 in response tothe addresses. Control logic 318 is also coupled to a cache register322.

Cache register 322 latches data, either incoming or outgoing, asdirected by control logic 318 to temporarily store data while the memoryarray 306 is busy writing or reading, respectively, other data. During awrite operation, data is passed from the cache register 322 to dataregister 324 for transfer to the memory array 306; then new data islatched in the cache register 322 from the I/O control circuitry 314.During a read operation, data is passed from the cache register 322 tothe I/O control circuitry 314 for output to memory controller 350 andthus to the processor; then new data is passed from the data register324 to the cache register 322. A status register 326 is coupled betweenI/O control circuitry 314 and control logic 318 to latch the statusinformation for output to memory controller 350 and thus to theprocessor.

For one embodiment, memory controller 350 is separate from memory device304, and memory device 304 is one of a plurality of memory devices 304coupled to memory controller 350 that is coupled to a processor, such asprocessor 170, as described above in conjunction with FIG. 1. For thisembodiment, memory device 304 may correspond to a memory device selectedfor testing. For another embodiment, memory controller 350 may be anintegral part of memory device 304, as indicated by the dashed line ofFIG. 3. For this embodiment, memory device 304, including memorycontroller 350, is one of a plurality of memory devices, where thememory controllers are coupled to a processor, such as processor 270, asdescribed above in conjunction with FIG. 2. For this embodiment, memorydevice 304, including memory controller 350, may correspond to a memorydevice selected for testing. Note that, the functionality of controller350 may be performed by control logic 318 and I/O control 314.

Memory device 304 receives control signals at control logic 318 frommemory controller 350 over a control signal line 335 that for oneembodiment is analogous to control signal line 135 of FIG. 1. Thecontrol signals may include a read enable RE#, a chip enable CE#, acommand latch enable CLE, an address latch enable ALE, a write enableWE#, and a write protect WP#. A ready/busy status signal R/B# is outputover control signal line 335 to indicate when memory device 304 isprocessing a PROGRAM or an ERASE operation or during a READ operation toindicate when data is being transferred from memory array 306.

Memory device 304 receives command signals (or commands), addresssignals (or addresses), and data signals (or data) from memorycontroller 350 at an input/output (I/O) port over a multiplexed I/Osignal line 340 and outputs data to memory controller 350 through theI/O port over I/O signal line 340. For one embodiment, I/O signal line340 is analogous to data signal line 125 and an address signal line 130of FIG. 1 in combination.

Specifically, the commands are received over input/output (I/O) pins I/O[0:7] corresponding to I/O signal line 340 at I/O control circuitry 314and are written into command register 328. The addresses are receivedover input/output (I/O) pins I/O [0:7] corresponding to signal line 340at I/O control circuitry 314 and are written into address register 316.The data are received over input/output (I/O) pins I/O [0:7] for an8-bit device or input/output (I/O) pins I/O [0:15] for a 16-bit deviceat I/O control circuitry 314 and are written into cache register 322.The data are subsequently written into data register 324 for programmingmemory array 306. Data are also output over input/output (I/O) pins I/O[0:7] for an 8-bit device or input/output (I/O) pins I/O [0:15] for a16-bit device. It will be appreciated by those skilled in the art thatadditional circuitry and control signals can be provided, and that thememory device of FIG. 3 has been simplified to help focus on theinvention. Additionally, while specific I/O pins are described inaccordance with popular conventions for receipt and output of thevarious signals, it is noted that other combinations or numbers of I/Opins may be used in the various embodiments.

Memory controller 350 receives external control signals from aprocessor, such as processor 170 of FIG. 1 or processor 270 of FIG. 2,over an external control signal line 365 that for one embodiment isanalogous to external control signal line 165 of FIG. 1 or an externalcontrol signal line 265 of FIG. 2. The control signals may include anoutput enable OE#, a chip enable CE#, a clock CLK, an address validdetect AVD, a write enable WE#, an interrupt INT, and a reset RP#. Aready control signal RDY is output over control signal line 365 to theprocessor. Memory controller 350 receives command signals (or commands),address signals (or addresses), and data signals (or data) from theprocessor at an input/output (I/O) port over a multiplexed external I/Osignal line 370 and outputs data to the processor through the I/O portover I/O signal line 370. For one embodiment, I/O signal line 370 isanalogous to external data signal line 155 and external address signalline 160 of FIG. 1 in combination or an external data signal line 255and an external address signal line 260 of FIG. 2 in combination.

Specifically, the commands are received over input/output (I/O) pins AD[0:7] corresponding to I/O signal line 370. The data are received overinput/output (I/O) pins AD [0:7] for an 8-bit device or input/output(I/O) pins AD [0:15] for a 16-bit device. Data are also output overinput/output (I/O) pins AD [0:7] for an 8-bit device or input/output(I/O) pins AD [0:15] for a 16-bit device. It will be appreciated bythose skilled in the art that while specific I/O pins are described inaccordance with popular conventions for receipt and output of thevarious signals, it is noted that other combinations or numbers of I/Opins may be used in the various embodiments.

Memory controller 350 includes at least one test mode that whenactivated maps external signal lines coupled to controller 350 to thesignal lines of memory device 304. For one embodiment, when the testmode is activated, lines of external control signal line 365 arerespectively mapped to portions (or lines) of control signal line 335,and external input/output (I/O) pins AD [0:7] or AD [0:15] of the memorypackage corresponding to external I/O signal line 370 are respectivelymapped to (I/O) pins I/O [0:7] or I/O [0:15] corresponding to I/O signalline 340. Specifically, for one embodiment, when the test mode isactivated, external signal lines of the memory package respectivelycorresponding to input control signals output enable OE#, chip enableCE#, clock CLK, address valid detect AVD, write enable WE#, interruptINT, and reset RP# and output ready control signal RDY are respectivelymapped to portions (or lines) of control signal line 335 respectivelycorresponding to input control signals read enable RE#, chip enable CE#,command latch enable CLE, address latch enable ALE, write enable WE#,and write protect WP# and output ready/busy control signal R/B#. Forembodiments as described above in conjunction with FIG. 2, controllermay include two test modes, where the just described test modecorresponds to one of the test modes, and the other test mode restrictsor prevents communication between memory device 304 and the processor.

For one embodiment, the above-mentioned test mode of controller 350 isactivated in response to the test-mode-activation signal received fromthe processor, such as processor 170 of FIG. 1 or processor 270 of FIG.2, where the test-mode-activation signal is indicative of a desire toenter a test mode and an identity of the one of the integrated circuitdevices. For another embodiment, the test-mode-activation command may bea sequence of commands, and controller 350 enters the test mode inresponse to a correct sequence of commands and performs theabove-described mapping. For some embodiments, the command sequence mayinclude low-voltage command signals having voltages that are on theorder of the normal operating voltages of memory device 304,high-voltage command signals having voltages that are above the normaloperating voltages of memory device 304, or a sequence of high- andlow-voltage commands. For one embodiment, the test-mode-activationcommand is received at controller 350 at the external signal linecorresponding to the reset RP#.

For one embodiment, the processor places memory device 304 into aninternal test mode by sending a pattern, sequence, or potential level ofone or more of the control signals (hereinafter called a test-modeenable signal) to memory device 304, e.g., to control logic 318 ofmemory device 304. For one embodiment, control logic 318 is adapted toenable the internal test mode and to control testing functions internalto memory device 304 during the internal test mode in response to thetest-mode enable signal.

For other embodiments, the test mode of controller 350 is exited inresponse to controller 350 receiving the test-mode-deactivation signalfrom the processor. For one embodiment, the test-mode- deactivationsignal may be sequence of commands, such as a sequence of low-voltagecommands, high-voltage commands, or both.

CONCLUSION

Embodiments of the invention provide multi-chip integrated circuitpackages, such as multi-chip memory packages. For one embodiment, amulti-chip integrated circuit package has a controller having a testmode. When the test mode is activated, the controller maps externalsignal lines coupled thereto to signal lines of one of the chips of themulti-chip integrated circuit package. For another embodiment, when thetest mode is activated, the controller at least restricts communicationbetween the external signal lines and remaining chips of the multi-chipintegrated circuit package. For another embodiment, a multi-chip memorypackage may have a single controller separate from the chips of themulti-chip integrated circuit package or a controller integrated on eachof the chips of the multi-chip integrated circuit package.

Although specific embodiments have been illustrated and describedherein, it will be appreciated by those of ordinary skill in the artthat any arrangement that is calculated to achieve the same purpose maybe substituted for the specific embodiments shown. Many adaptations ofthe invention will be apparent to those of ordinary skill in the art.Accordingly, this application is intended to cover any adaptations orvariations of the invention. It is manifestly intended that thisinvention be limited only by the following claims and equivalentsthereof.

1. A method of testing a memory chip of a multi-chip memory package,comprising: receiving a first external signal at a controller integratedon the memory chip to select the memory chip for testing; activating atest mode of the controller in response to receiving the first externalsignal; mapping external signal lines coupled to the controller tosignal lines of the memory chip selected for testing in response toactivating the test mode of the controller; receiving a second externalsignal at controllers integrated on each of the remaining memory chipsof the multi-chip memory package; and at least restricting communicationbetween external signal lines coupled to the controllers integrated oneach of remaining memory chips and each of remaining memory chips inresponse to receiving the second external signal at the controllersintegrated on each of the remaining memory chips.
 2. The method of claim1 further comprises deactivating the test mode of the controllerintegrated on the memory chip selected for testing to restore arelationship between the external signal lines and the signal lines ofthe memory chip selected for testing to that which occurs during normaloperation of the multi-chip memory package in response to receiving athird external signal at the controller integrated on the memory chipselected for testing.
 3. The method of claim 2 further comprisesrestoring a relationship between the external signal lines coupled tothe controllers integrated on each of the remaining memory chips andeach of the remaining memory chips to that which occurs during normaloperation of the multi-chip memory package in response to receiving afourth external signal at the controllers integrated on each of theremaining memory chips.
 4. The method of claim 1, wherein operation ofthe controller during the test mode after the mapping differs from thatwhich occurs during normal operation of that controller.
 5. The methodof claim 1, wherein each external signal line used during the test modeis also used to convey signals to and/or from the controller duringnormal operation of that controller.
 6. The method of claim 1, whereinat least restricting communication comprises preventing communication.7. A method of testing a multi-chip memory package, comprising:receiving an external signal at controllers integrated on each of aplurality of memory chips of the multi-chip memory package; activating afirst test mode of a controller of a memory chip in response toreceiving the external signal at that controller; mapping externalsignal lines coupled to the controller, whose first test mode isactivated, to signal lines of the memory chip with that controller inresponse to activating the first test mode; activating a second testmode of the controllers integrated on each of the remaining memory chipsin response to receiving the external signal at those controllers; andat least restricting communication between external signal lines coupledto the controllers integrated on each of remaining memory chips and eachof remaining memory chips in response to activating the second test modeof the controllers integrated on each of the remaining memory chips. 8.The method of claim 7, wherein the external signal is a first externalsignal and further comprising receiving a second external signal at eachof the controllers, wherein receiving the second external signal at thecontroller whose first test mode is activated deactivates the first testmode and receiving the second external signal at the controllers whosesecond test modes are activated deactivates the second test modes. 9.The method of claim 7, wherein the memory chip with the controller whosefirst test mode is activated has an address that matches an addressincluded in the external signal.
 10. The method of claim 9, wherein thememory chips with the controllers whose second test modes are activatedhave addresses that do not match the address included in the externalsignal.
 11. A multi-chip integrated circuit package, comprising: aplurality of integrated circuit devices; and a controller integrated oneach of the integrated circuit devices; wherein each controller hasfirst and second test modes; wherein when the first test mode of acontroller is activated that controller maps external signal linescoupled thereto to one or more signal lines of the integrated circuitdevice on which that controller is integrated; and wherein when thesecond test mode of a controller is activated that controller at leastrestricts communication between the external signal lines and one ormore signal lines of the integrated circuit device on which thatcontroller is integrated.
 12. The multi-chip integrated circuit packageof claim 11, wherein the first and second test modes are activated inresponse to receiving at least one external signal at that controller.13. The multi-chip integrated circuit package of claim 12, wherein thefirst test mode of an integrated circuit device is activated in responseto that integrated circuit device receiving an external signalcomprising an address that matches an address of that integrated circuitdevice.
 14. The multi-chip integrated circuit package of claim 12,wherein the second test mode of an integrated circuit device isactivated in response to that integrated circuit device receiving anexternal signal comprising an address that does not match thatintegrated circuit device.
 15. The multi-chip integrated circuit packageof claim 12, wherein the first test mode of an integrated circuit deviceis activated in response to the integrated circuit device receiving afirst external signal and the second test mode of the integrated circuitdevice is activated in response to the integrated circuit devicereceiving a second external signal.
 16. The multi-chip integratedcircuit package of claim 12, wherein when the second test mode of acontroller is activated that controller prevents communication betweenthe external signal lines and one or more signal lines of the integratedcircuit device on which that controller is integrated.
 17. Themulti-chip integrated circuit package of claim 12, wherein each externalsignal line used during the first test mode of a controller is also usedto convey signals to and/or from that controller during normal operationof that controller.
 18. The multi-chip integrated circuit package ofclaim 11, wherein when the first test mode is activated for one of thememory chips, the second test mode is activated for the remaining memorychips.
 19. A memory module, comprising: one or more multi-chip memorypackages, wherein at least one of the one or more multi-chip memorypackages comprises: a plurality of memory devices; and a controllerintegrated on each of the memory devices; wherein each controller hasfirst and second test modes; wherein when the first test mode of acontroller is activated that controller maps external signal linescoupled thereto to one or more signal lines of the integrated circuitdevice on which that controller is integrated; and wherein when thesecond test mode of a controller is activated that controller at leastrestricts communication between the external signal lines and one ormore signal lines of the integrated circuit device on which thatcontroller is integrated.
 20. An electronic system, comprising: aprocessor; and at least one multi-chip memory package, the at least onemulti-chip memory package, comprising: a plurality of memory devices;and a controller integrated on each of the memory devices and coupled tothe processor by first signal lines; wherein each controller has firstand second test modes; wherein when the first test mode of a controlleris activated that controller maps at least a portion of the first signallines to at least a portion of second signal lines of the integratedcircuit device on which that controller is integrated; and wherein whenthe second test mode of a controller is activated that controller atleast restricts communication between at least a portion of the firstsignal lines and at least a portion of second signal lines of theintegrated circuit device on which that controller is integrated. 21.The electronic system of claim 20, wherein the test modes are activatedin response to receiving at least one signal at each controller from theprocessor.